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#Material & Analysis

35 Results Found
  • Synthesis of silica nanofibers via disassembly of a reverse type 2D hexagonal mesostructure​

  • Higher order use of degraded plastic (Styrofoam) as insect repellent

  • Mitsutake Suematsu of Sony Group Corporation, contributes research results to the October issue of Plastics magazine of Japan Industrial Publishing Co., Ltd.

  • Bending Deformation Driven by Molecular Rotation

  • Scalable and Stable Manufacture of Molecular-Sized Silica Nanoparticles by Evaporation-Induced Self-Assembly

  • Latest progress of high-efficient blue and green VCSELs with curved mirror

  • A semi-automated material exploration scheme to predict the solubilities of tetraphenylporphyrin derivatives

  • Atomic-Scale Dynamics at Solid–Liquid Nanointerfaces Induced by Electron-Beam Irradiation

  • Narrow Emission of Blue GaN-Based Vertical-Cavity Surface-Emitting Lasers With a Curved Mirror

  • INNOVATIVE MATERIAL DEVELOPMENT

  • Eco-friendly high-performance cellulose materials

  • Nanostructure–Optical Property Relationship in CuInSe2/ZnS Core/Shell Quantum Dots Revealed by Multivariate Statistical Analysis of X-ray Spectrum Images

  • Longitudinal mode control in long cavity VCSELs with a curved mirror

  • Broadband Electromagnetic Absorber​ Based on 3D Conical Helix Metamaterials

  • Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM

  • Highly efficient operation of curved mirror VCSELs and their uniform characteristics

  • Mode control in long cavity VCSELs with a curved mirror

  • The Observation of Local Electric Fields in GaN/AlGaN/InGaN Multi-heterostructures by Differential Phase Contrast STEM

  • Absolute Measurement of Emission Internal Quantum Efficiency in III-Nitride Semiconductors by Simultaneous PhotoAcoustic and Photoluminescence Spectroscopy

  • Impact of graphene-molecular interaction on collective orientation barrier for organic film growth

  • Dry Etching Damage and Alloy Composition Analysis of GaN-Based Semiconductors Using Electron Energy-Loss Spectroscopy